Mostrando ítems 1-2 de 2
Arbiol i Cobos, Jordi (Fecha de defensa: 2001-07-19)
Recently, there has been an increasing interest in the electronics world for those aspects related to semiconducting gas sensor (SGS) materials. In view of the increasingly strict legal limits for ...
Estradé Albiol, Sònia (Fecha de defensa: 2009-02-21)
In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and inelastic scattering by the solid state thin sample that is being characterised. In the event of inelastic ...