2024-03-29T12:54:02Zhttps://www.tdx.cat/oai/requestoai:www.tdx.cat:10803/4002002017-09-01T14:17:58Zcom_10803_120col_10803_163
http://hdl.handle.net/10803/400200/ore.xml
2017-02-13T08:52:42Z
2017-02-13T08:52:42Z
TDX (Tesis Doctorals en Xarxa)
TCAD study of interface traps-related variability in ultra-scaled MOSFETs
Velayudhan, Vikas
2017-02-13T08:52:42Z
ORIGINAL
CC-LICENSE
CC-LICENSE
CC-LICENSE
MEDIA_DOCUMENT