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TDX Home > Universitat Autònoma de Barcelona > Departament d'Enginyeria Electrònica > Departament d'Enginyeria Electrònica by author/director

Departament d'Enginyeria Electrònica By authors/directors "Aymerich Humet, Xavier"

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Caracterització a escala nanomètrica de la degradació I. Ruptura dielèctrica del SiO2 en dispositius MOS mitjançant CAFM (Date of defense: 2003-04-04)

Porti Pujal, Marc

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